Vonesh, Edward F. <br/><br/>
Linear and nonlinear models for the analysis of repeated measurements / 
Edward F. Vonesh and Vernon M. Chinchilli 
 - New York :  Marcel Dekker,  1997 
 - xii, 560p. ;  23cm.+  1 floppy 
 - Statistics : text books and monographs ;  154 .
<br/><br/><label>ISBN: </label>0824782488 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Experimental design<br/>Multivariate analysis
<br/><br/><label>Dewey Class. No.: </label>519.535  / VON