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Mathematical models for systems reliability / Benjamin Epstein, Ishay Weissman.

By: Contributor(s): Material type: TextTextPublication details: Boca Raton : CRC Press, c2008.Description: 253 p. : ill. ; 25 cmISBN:
  • 9781420080827 (alk. paper)
  • 1420080822 (alk. paper)
Subject(s): DDC classification:
  • 620/.00452015118 22
LOC classification:
  • TA169 .E67 2008
Online resources:
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Holdings
Item type Current library Call number Status Date due Barcode Item holds
Book Book Kozhikode 519.248 EPS/M (Browse shelf(Opens below)) Available IIMKO-33971
Total holds: 0

"A Chapman & Hall book."

Includes bibliographical references (p. 247-250) and index.

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