Mathematical models for systems reliability / Benjamin Epstein, Ishay Weissman.
Material type: TextPublication details: Boca Raton : CRC Press, c2008.Description: 253 p. : ill. ; 25 cmISBN:- 9781420080827 (alk. paper)
- 1420080822 (alk. paper)
- 620/.00452015118 22
- TA169 .E67 2008
Item type | Current library | Call number | Status | Date due | Barcode | Item holds | |
---|---|---|---|---|---|---|---|
Book | Kozhikode | 519.248 EPS/M (Browse shelf(Opens below)) | Available | IIMKO-33971 |
Total holds: 0
"A Chapman & Hall book."
Includes bibliographical references (p. 247-250) and index.
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