Linear and nonlinear models for the analysis of repeated measurements / Edward F. Vonesh and Vernon M. Chinchilli

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Material type: Text

TextSeries: Publication details: New York : Marcel Dekker, 1997Description: xii, 560p. ; 23cm.+ 1 floppyISBN:

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Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Book	Calcutta	519.535 VON (Browse shelf(Opens below))	Available		IIMC-112109

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